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Job Description:
Develop ATE Test Solution for Memory Controller.
Design PCB and develop Test program for a controller ASIC. Interfaces with
Product, Design, DFT, Production and Reliability engineering to solve problems.
Create Test Requirement and Test vectors requirement
Design Hardware for Wafer Sort, Reliability & Final Test with SI / PI specs.
Compile ASIC test Patterns and Test Program development
To bring-up ASIC and Temperature testing at wafer and package level
Verify using Bench Instruments, R&R for Test Program, correlation, release and Factory Support
PE / Design / DFT / Verification / Characterization / SI team interactions
Test Program Test Time Reductions and Yield Improvement
The ideal individual must have proven ability to achieve results in a fast moving, dynamic environment. Self-motivated and self-directed, however, must have demonstrated ability to work well with people. A proven desire to work as a team member, both on the same team and outside of the team.
Ability to troubleshoot and analyze complex problems.
Ability to multi-task and meet deadlines.
Excellent communication (written and verbal) and interpersonal skills.
About Company:
